System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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PXI Very High Density Versatile 2 Amp Multiplexer
40-612A-002
The 40-612A Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves. Typical applications include signal routing in ATE and data acquisition systems. The 40-612 module uses high quality electro-mechanical relays, connections are made via a front panel 160 pin DIN41612 connector....show more -
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, us...show more -
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USB Data Communications Multiplexers
These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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PXIe Vector Network Analyzer, 300 kHz to 20 GHz
M9374A
Pay for only the frequency range you need with a choice of six frequency ranges up to 26.5 GHz Improve accuracy, yield and margins with the best PXI VNA speed, dynamic range, trace noise and stability Add functionality to your test system with a full 2-port VNA that fits in a single PXI slot Address your multiport applications needs by cascading multiple models Increase throughput and lower costs by adding modules in a multi-site configuration
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Waveform Function Generators
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Dual HD Test Signal Generator with Embedded Audio
7751TG2-HD
The 7751TG2-HD Test Signal Generator provides a cost-effective method of generating 1.5Gb/s HDTV 4:2:2 and 4:4:4 test signals. The 7751TG2-HD is ideal for checking signal path integrity, or to determine system performance over varying cable lengths. The 7751TG2-HD generates test signals in a wide variety of SMPTE 292M video formats.
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Battery Data Logger
BDL-3926C
Kongter Test & Measurement Co., Limited
BDL-3926C Battery Data Logger is wireless monitoring device for string voltage, cell voltage, current and temperature. It works individually to reflect battery status or co-works with Kongter’s other battery test equipments like battery charger and K-3980 DC load bank. For different battery systems, it has customized configuration from 12V to 480V or upper. And it has easy expansion for all battery systems.
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Optical Switch Boxes
An optical switch box is needed so that automated test platforms can permit the system to measure the performance of transmitters and receivers at multiple wavelengths or channels. The MLO4034 Optical Switch Box incorporates a WDM demultiplexer, integrated power meters, variable optical attenuators, and optical switches to form an integrated switch matrix. It enables receivers and transmitters to be tested at up to four wavelengths or channels.
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Redundant Strap down INS ATE Test Station
Redundant Strap down Inertial Navigation System (RESINS) checkout test station comprises of cPCI chassis with various functional I/O modules like ADC, DAC, DIO, VFC, Relay matrix, MIL 1553, GPIB, Serial communication interfaces and Custom Built System interface adaptor.
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Semiconductor Test Solutions Test System
EV500
The EV500 Test System is the industry’s first self-contained tester based on the AXIe standard. It provides all of the power, cooling, and device loadboard interfacing required for up to 5 AXIe instrument cards. The EV500 can be used as a standalone test system or as a rack mountable subsystem upgrade for existing test systems. Device loadboards use high-density direct connections to the AXIe instrument cards and can easily be interchanged as required for different devices.
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FPGA PXI High-Performance Digital I/O Card
GX3700
The GX3700 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features 47,500 logic elements and 2.1 kb of memory. The GX3700 is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own cust...show more -
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Military & Aerospace Solutions
Military and aerospace electronics spans a vast array of complex applications, including communications, vehicle control, radar, electronic warfare and countless others. Although the applications are widely varied, there are similarities in the requirements as well. Typically these electronic systems, whether COTS (Commercial Off- the-Shelf) or custom developed for the application, share similar requirements for ruggedness, reliability, and precision. Our customers don’t have room for error, mis...show more -
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Software
TFT Test Systems
Materials Development Corporation
Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.
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120W Power Supply, 15V, 7A or 30V, 4A
E3632A
Keysight basic DC power supplies offer essential features for a tight budget. The single output, 120-200 W, GPIB, E3632A-E3634A provide dual range outputs; small, compact size for bench use; low output ripple and noise; as well as built-in measurements and basic programmable features with GPIB and RS232 interface. The Keysight 120W, GPIB, single output E3632A is a high performance supply optimized for manual and basic automated testing; and, with a combination of benchtop capabilities and system features, it is designed to help improve measurement quality and reduce test time.
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100 Pin Breakout Interface
VSI-Breakout-100
The VSI-Breakout-100 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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USB Powered, 4 channel, 24-bit Data Acquisition System
DATS-solo
The DATS-solo is a pocket-sized, ultra portable, high quality, 24-bit data acquisition system. The fully integrated DATS software provides options for acoustic & vibration testing, rotating machinery analysis, NVH tests, hammer impact analysis, resonance testing and modal analysis.
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Detector Testing
CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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LST-2000 Laser Safety Test System
Hangzhou Everfine Photo-E-Info Co., LTD
The system can measure the spectral power distribution, radiant power, radiant energy, apparent light source size, pulse energy and other parameters of the laser light source, and classify the laser light source according to the standard IEC 60825.1. Because laser measurement involves more condition parameters, limit calculation and judgment process is complex, so this system adopts systematic design, the measurement complexity is simplified, the hardware adopts componentization module, users on...show more -
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Software / Firmware
You can connect to our Ethernet test box right now and send/receive remote commands. It is located at fixed IP address 104.63.176.50 (tcp port 3001). The most often asked question about our test systems is “How easy are they to remotely control”? So we built up a test system and put it on an outward-facing IP address so that any of our customers can interact with our firmware.
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Computer Based Audio Component Test System
DATS V3
Rugged aluminum housing with detachable test leads and built-in precision calibration resistorTighter tolerances on internal components for more precise measurementsIncreased output capability means greater separation from the noise floor, resulting in more accurate measurementsDATS Linearity Test for comparing parameters and impedance plots at multiple drive levelsOptional under desk mounting brackets included to save desk spaceOnly 1" H x 2-1/2" W x 4-1/8" D for easy portability
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Pressure / Manometers
Sper Scientific handheld manometers, vacuum, and pressure meters are ideal for measuring low differential pressure in clean rooms, test and balance, medical equipment, HVAC, pneumatic systems and computer peripherals.
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Electrophotography
Quality Engineering Associates Inc.
Drawing on years of applications experience, QEA has developed a comprehensive line of tools for evaluating EP printer components and sub-systems. This unique family of test systems embodies innovative engineering solutions and a fundamental understanding of the physics of EP processes to give you “must-have” tools for high-speed printer R&D and quality control. These non-contact, non-destructive tools emulate the EP printing process and deliver quantitative data you can rely on. QEA tools are ideal for:
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USB Power Sensors 10 MHz to 26.5 GHz
GT-8554B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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Aviation Engine Test Cells
1.Design, manufacture and installation: ● Thrust stand components: thrust measurement system, adapter, superstructure etc. ● Facility subsystems: DAQ, supply systems (fuel, oil) etc.2.Civil construction works: site survey, building works etc.3.Contracting: ● Turn-key – MERA is able to supply a “turn-key” test cell including civil works, thrust stand, DAQ, all necessary facility subsystems, specialized software, throttle control level and etc. ● Joint –...show more -
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Test Receiver
NTR GNSS
Our primary objective is to provide a high performance and fully flexible test receiver for all types of GNSS systems. Thus, the NTR fully supports all existing navigation systems. The signal processing is fully flexible. The high performance correlation engine with up to 80 channels is implemented in a powerful set of FPGAs. Signal acquisition and tracking are realized on a high performance embedded ARM Cortex A8.Supporting up to 4 L-band frequencies in parallel, the NTR GNSS test receiver supports all current GNSS transmission frequencies. Due to its plug-in design, the RF front-end can easily be customized for special filtering and other frequencies.
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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CMP Process and Material Characterization System
CP-4
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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AIS Air Data Test System
F-16
The primary function of the Air Data Test System (ADTS) is to perform testing and fault isolation of pneumatic-type Units Under Test (UUTs). To test a UUT, the operator connects the associated Line Replaceable Unit (LRU) Integrated Test Adapter (ITA) to the rackmount Avionics Intermediate Shop (AIS) test station. The operator connects the ADTS to the IAIS via an RS-232 Interface and then finally, connects the UUT to the ADTS using the supplied cables and hoses.
